Welcome to μSTEM.
A Scanning Transmission Electron Microscopy computing suite.
Modelling the inelastic scattering of fast electrons, L.J. Allen, A.J. D'Alfonso and S.D. Findlay, Ultramicroscopy, Vol. 151, pp. 11-22, (2015).
The latest version and precompiled executables can be found at
Please forward your comments and suggestions to: